Accession Number:

ADD019270

Title:

Method for Measuring Intramolecular Forces by Atomic Force Microscopy.

Descriptive Note:

Patent Application, Filed 27 Jan 99,

Corporate Author:

DEPARTMENT OF THE NAVY WASHINGTON DC

Report Date:

1999-01-27

Pagination or Media Count:

30.0

Abstract:

A method is disclosed for measuring intramolecular forces within a sample compound by providing an atomic force microscope that includes a sample support member and a cantilever. The sample support member has a plurality of protrusions, and each protrusion has an apical substrate region that has been chemically modified to have a sample compound immobilized thereon. The cantilever has a fixed end and a free end, the free end having a surface region that has been chemically modified to have a grasping compound immobilized thereon. To measure intramolecular forces within the sample compound, the relative position and orientation of the cantilever and the sample support member are controlled to select a particular protrusion and to allow a molecule of the grasping compound to bind with a molecule of the sample compound. Then, the relative position and orientation of the cantilever and the sample support member are controlled to vary the distance between the cantilever and the sample support member so that the forces exerted on the cantilever as the distance between the cantilever and the sample support member is varied and as the molecule of the sample compound is stretched between the cantilever and the sample support member can be measured.

Subject Categories:

  • Atomic and Molecular Physics and Spectroscopy
  • Optics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE