Accession Number:

ADD019037

Title:

System for Determining Size and Location of Defects in Material by use of Microwave Radiation

Descriptive Note:

Patent Application, Filed 12 Feb 97

Corporate Author:

DEPARTMENT OF THE NAVY WASHINGTON DC

Personal Author(s):

Report Date:

1997-02-12

Pagination or Media Count:

15.0

Abstract:

Microwave radiation emitted from a single antenna is focused on a targeted material from which back-scattering of reflected radiation is received by the same antenna to provide signal measurement data from which detected material defects are evaluated by determination of void location and size. Antenna position and orientation is adjusted to obtain the signal measurement data from back-scattering of the microwave radiation along at least two target incidence paths from the same target location, one of which is normal to said targeted surface of the material and the other oblique thereto at a scattering angle at which the back-scattering signal radiation intensity is minimized.

Subject Categories:

  • Electrical and Electronic Equipment
  • Laminates and Composite Materials
  • Radiofrequency Wave Propagation

Distribution Statement:

APPROVED FOR PUBLIC RELEASE