System for Determining Size and Location of Defects in Material by use of Microwave Radiation
Patent Application, Filed 12 Feb 97
DEPARTMENT OF THE NAVY WASHINGTON DC
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Microwave radiation emitted from a single antenna is focused on a targeted material from which back-scattering of reflected radiation is received by the same antenna to provide signal measurement data from which detected material defects are evaluated by determination of void location and size. Antenna position and orientation is adjusted to obtain the signal measurement data from back-scattering of the microwave radiation along at least two target incidence paths from the same target location, one of which is normal to said targeted surface of the material and the other oblique thereto at a scattering angle at which the back-scattering signal radiation intensity is minimized.
- Electrical and Electronic Equipment
- Laminates and Composite Materials
- Radiofrequency Wave Propagation