Method and Apparatus for Determining Both Density and Atomic Number of a Material Composition Using Compton Scattering
Patent, Filed 31 May 96, patented 17 Mar 98
DEPARTMENT OF THE NAVY WASHINGTON DC
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An x-ray backscatter tomography system includes a collimated x-ray source for directing a collimated beam towards a target at a select position and orientation a first detector array for measuring photons scattered at a selected first angle and a second detector array for measuring photons scattered at a selected second angle different from the first angle. The system is also responsive to the first and second detectors for calculating the density and atomic number of the target.
- Atomic and Molecular Physics and Spectroscopy
- Nuclear Physics and Elementary Particle Physics