Accession Number:

ADD018216

Title:

Method and Apparatus for Determining Both Density and Atomic Number of a Material Composition Using Compton Scattering.

Descriptive Note:

Patent Application, Filed 31 May 96,

Corporate Author:

DEPARTMENT OF THE NAVY WASHINGTON DC

Personal Author(s):

Report Date:

1996-05-31

Pagination or Media Count:

20.0

Abstract:

An x-ray backscatter tomography system includes a collimated x-ray source for directing a collimated beam towards a target at a select position and orientation, a first detector array for measuring photons scattered at a selected first angle, and a second detector array for measuring photons scattered at a selected second angle different from the first angle. The system also includes means responsive to the first and second detectors for calculating the density and atomic number of the target.

Subject Categories:

  • Atomic and Molecular Physics and Spectroscopy
  • Nuclear Physics and Elementary Particle Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE