Method and Apparatus for Determining Both Density and Atomic Number of a Material Composition Using Compton Scattering.
Patent Application, Filed 31 May 96,
DEPARTMENT OF THE NAVY WASHINGTON DC
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An x-ray backscatter tomography system includes a collimated x-ray source for directing a collimated beam towards a target at a select position and orientation, a first detector array for measuring photons scattered at a selected first angle, and a second detector array for measuring photons scattered at a selected second angle different from the first angle. The system also includes means responsive to the first and second detectors for calculating the density and atomic number of the target.
- Atomic and Molecular Physics and Spectroscopy
- Nuclear Physics and Elementary Particle Physics