Accession Number:

ADD015371

Title:

Emittance Measuring Device for Charged Particle Beams.

Descriptive Note:

Patent, Filed 5 Jul 90, Patented 9 Jun 92,

Corporate Author:

DEPARTMENT OF THE NAVY WASHINGTON DC

Personal Author(s):

Report Date:

1992-06-09

Pagination or Media Count:

5.0

Abstract:

The invention is a device to measure the emittance of a charged particle beam. The device is capable of providing precise time resolution limited only, by the chosen detector. The device allows a complete emittance determination as a function of time. The preferred embodiment of the invention comprises a plurality of thin foils which generate an optical transition radiation OTR pattern a lens system to collect the OTR pattern from the said foils an optical mask to allow passage of the OTR pattern and a detector array or similar device placed behind the mask which intercepts, senses and measures the point source OTR pattern for each perforation in the mask.

Subject Categories:

  • Particle Accelerators
  • Optical Detection and Detectors

Distribution Statement:

APPROVED FOR PUBLIC RELEASE