Emittance Measuring Device for Charged Particle Beams.
Patent, Filed 5 Jul 90, Patented 9 Jun 92,
DEPARTMENT OF THE NAVY WASHINGTON DC
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The invention is a device to measure the emittance of a charged particle beam. The device is capable of providing precise time resolution limited only, by the chosen detector. The device allows a complete emittance determination as a function of time. The preferred embodiment of the invention comprises a plurality of thin foils which generate an optical transition radiation OTR pattern a lens system to collect the OTR pattern from the said foils an optical mask to allow passage of the OTR pattern and a detector array or similar device placed behind the mask which intercepts, senses and measures the point source OTR pattern for each perforation in the mask.
- Particle Accelerators
- Optical Detection and Detectors