Thin Film Vector Magnetometer.
Patent, Filed 16 May 90, patented 24 Sep 91,
DEPARTMENT OF THE NAVY WASHINGTON DC
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A thin film vector magnetometer is configured to produce an output that varies linearly with the component of an externally applied magnetic field in the plane of a thin film chip portion thereof along a predefined sensitivity axis. The sensitivity and linear dynamic range of the thin film vector magnetometer are intimately related to each other through a bias field supplied by a bias magnet portion of the device. The bias field also defines the sensitivity axes of the magnetometer which is orthogonal to the unidirectional bias field supplied by the bias magnet.
- Magnetic and Electric Field Detection and Detectors
- Test Facilities, Equipment and Methods