Circuit Probing System.
Patent, Filed 4 Jun 90, patented 11 Jun 91,
DEPARTMENT OF THE NAVY WASHINGTON DC
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A probing system for determining a voltage at a node during normal operation of a circuit. An input driver drives the circuit normally. A normal output on an output line associated with the node, is recorded. A probe is brought in contact with the node. Various node voltages are applied to the probe and thus to the node, until the output on the output line matches the recorded output. The probe voltage that creates the match is the voltage at the node, during normal operation of circuit. Author
- Test Facilities, Equipment and Methods
- Electrical and Electronic Equipment