Emittance Measuring Device for Charged Particle Beams.
Patent Application, Filed 5 Jul 90,
DEPARTMENT OF THE NAVY WASHINGTON DC
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The invention is a device to measure the emittance of a charged particle beam. The device is capable of providing precise time resolution limited only by the chosen detector. The device allows a complete emittance determination as a function of time. The preferred embodiment of the invention comprises a plurality of thin foils 11 which generate an optical transition radiation OTR pattern 13 a lens system 14 to collect the OTR pattern 13 from the said foils 11 an optical mask 16 to allow passage of the OTR pattern 13 and a detector array 17 or similar device placed behind the mask 16 which intercepts, senses and measures the point source OTR pattern 13 for each perforation in the mask. Keywords Patent applications. jhd
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