Electron Beam Apparatus for Testing Infrared Detectors in a Cryogenically Shielded Environment.
Patent, Filed 8 Dec 88, patented 29 May 90,
DEPARTMENT OF THE NAVY WASHINGTON DC
Pagination or Media Count:
An apparatus for testing infrared detectors in response to a selectively controlled electron beam within a cryogenically shielded environment includes a cryostat having an aperture which is positioned adjacent to a scanning electron microscope. An electron beam emitted from the microscope propagates through the aperture to illuminate an infrared detector mounted within the cryostat so that the detector can be tested in an environment substantially free of spurious infrared radiation. Patents.
- Infrared Detection and Detectors
- Particle Accelerators