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Accession Number:
ADD014251
Title:
Method of Identifying the Composition of a Material Sample
Descriptive Note:
Patent Application, Filed 13 Sep 1989
Corporate Author:
DEPARTMENT OF THE ARMY WASHINGTON DC
Report Date:
1989-09-13
Pagination or Media Count:
7.0
Abstract:
Certain material samples useful in microelectronics and other disciplines can be exceedingly sensitive to the rigors of transportation including damage and contamination. The general objective of this invention is to provide a method of identifying a material sample, particularly when the material sample is in a remote location. A more particular object of the invention is to provide such a method that permits safe shipment of the material sample, without contamination, for identification. The sample material is rubbed with an abrasive coated paper or cloth such as emery paper until streaking appears on the emery paper. The emery paper is then analyzed in the laboratory for the composition of the material sample embedded within it by a method such as energy dispersive x-ray spectroscopy EDS. Because analytical techniques such as EDS can perform qualitative and quantitative chemical analysis on very small quantities of sample down to micron or submicron dimension, it is necessary to have down to micron or submicron dimensions, it is necessary to have only a representative sampling of the material sample in question. The emery paper accomplishes this sampling by containing the sample material because it is embedded in the abrasive material even during transportation. The types of sample materials that can be analyzed include plating on metals, metals, corrosion products, coatings, residues, glasses, ceramics, minerals, and ores.
Distribution Statement:
APPROVED FOR PUBLIC RELEASE
