Thermal Test Chamber Device.
Patent Application, Filed 27 Oct 88,
DEPARTMENT OF THE ARMY WASHINGTON DC
Pagination or Media Count:
A thermal test chamber device is provided that includes two half housing sections that are secured together to define a chamber there between with a window for viewing inside the chamber and with inlet and outlet means for supplying and exhausting a medium to and from the chamber. The lower half housing section has electrical circuit means mounted relative thereto for testing a semiconductor chip specimen when presented relative thereto. Keywords Patent applications, Thermal cycling. aw
- Electrical and Electronic Equipment
- Test Facilities, Equipment and Methods