Accession Number:

ADD013924

Title:

Thermal Test Chamber Device.

Descriptive Note:

Patent Application, Filed 27 Oct 88,

Corporate Author:

DEPARTMENT OF THE ARMY WASHINGTON DC

Report Date:

1988-10-27

Pagination or Media Count:

11.0

Abstract:

A thermal test chamber device is provided that includes two half housing sections that are secured together to define a chamber there between with a window for viewing inside the chamber and with inlet and outlet means for supplying and exhausting a medium to and from the chamber. The lower half housing section has electrical circuit means mounted relative thereto for testing a semiconductor chip specimen when presented relative thereto. Keywords Patent applications, Thermal cycling. aw

Subject Categories:

  • Electrical and Electronic Equipment
  • Test Facilities, Equipment and Methods

Distribution Statement:

APPROVED FOR PUBLIC RELEASE