Method for Analyzing Materials Using X-Ray Fluorescence.
Patent Application, Filed 1 Aug 88,
DEPARTMENT OF THE NAVY WASHINGTON DC
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The invention pertains broadly to x-ray techniques used to analyze materials, and in particular techniques based on x-ray fluorescence. Accordingly, and object of the invention is to enable one to do quantitative elemental analysis using x-ray fluorescence, as well fine structure analysis. Another object of the invention is to enable one to do the foregoing simply, and with one apparatus, and with increased sensitivity, and with less complicated and expensive detectors. Keywords Patent application X-ray absorption analysis. KT
- Test Facilities, Equipment and Methods
- Physical Chemistry
- Nuclear Physics and Elementary Particle Physics