Accession Number:

ADD013637

Title:

Anisotropic Magnetoresistance Measurement Apparatus and Method Thereof.

Descriptive Note:

Patent Application, Filed 20 Jan 88,

Corporate Author:

DEPARTMENT OF THE NAVY WASHINGTON DC

Personal Author(s):

Report Date:

1988-01-20

Pagination or Media Count:

17.0

Abstract:

The present invention is an apparatus and method for the nondestructive testing of the anisotropic magnetoresistance parameters of a film. A plurality of contacts points are securely disposed in a generally planar support means and engagable with a surface of the film for measuring the anisotropic magnetoresistance parameters of the film in accord with a predetermined equation. Patent Applications

Subject Categories:

  • Test Facilities, Equipment and Methods
  • Electricity and Magnetism

Distribution Statement:

APPROVED FOR PUBLIC RELEASE