Anisotropic Magnetoresistance Measurement Apparatus and Method Thereof.
Patent Application, Filed 20 Jan 88,
DEPARTMENT OF THE NAVY WASHINGTON DC
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The present invention is an apparatus and method for the nondestructive testing of the anisotropic magnetoresistance parameters of a film. A plurality of contacts points are securely disposed in a generally planar support means and engagable with a surface of the film for measuring the anisotropic magnetoresistance parameters of the film in accord with a predetermined equation. Patent Applications
- Test Facilities, Equipment and Methods
- Electricity and Magnetism