A Fault Tolerant Test Apparatus for Large RAMS (Random Access Memories).
Patent Application, Filed 12 Jun 87,
DEPARTMENT OF THE AIR FORCE WASHINGTON DC
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The RAM is partitioned into modules, each of which appear as the leaf node of a binary interconnect network. This network carries the addressdatacontrol bus which permits the nodes to communicate between themselves and with the outside world. The address, data and control signals are applied to the root node. The most significant address bit is decoded, generating either a left subtree or a right subtree select. The other signals would be buffered and propagated down the tree. The solution process occurs at each level within the bus until finally a single leaf node would be selected. Within the node, then, the internal timing and control unit would access the data requested, sending it up the tree or writing the value on the data bus, into the addressed location.
- Electrical and Electronic Equipment