Patent, Filed 13 Nov 80, patented 18 Jan 83,
DEPARTMENT OF THE NAVY WASHINGTON DC
Pagination or Media Count:
The present invention is for measuring specular reflectance from a given sample. In particular, it pertains it pertains to making absolute measurements with the reflectometer by the use of multiple pass reflection off of the sample. This permits high reflectivity samples to be accurately measured by repeating the number of reflections off the sample a known number of times. An apparatus and method to measure the absolute reflectivity of a sample is made by use of a multiple pass reflectometer. A given light beam permits measurement of the absolute reflectivity by comparing a portion of the light beam in a reference White cell to the change in light of another portion of the beam which undergoes equivalent reflections except for the addition of the sample in one configuration as compared to the other.