Accession Number:

ADD013019

Title:

High-Sensitivity Infrared Polarimeter.

Descriptive Note:

Patent Application,

Corporate Author:

DEPARTMENT OF THE ARMY WASHINGTON DC

Personal Author(s):

Report Date:

1987-05-04

Pagination or Media Count:

7.0

Abstract:

This paper discusses an infrared polarimeter that measures the amount or degree of the rotation of the plane of polarization of plane polarized radiation after the radiation has passed through a cadium sulfide Cds wafer. Relatively small magnetic fields are used and increased sensitivity is realized by using a chopping wheel to chop the laser beam, providing a reference frequency, and by using a synchronous detector to obtain high signal to noise ratios of the detected signal. As a result of greater sensitivity of the high-sensitivity infrared polarimeter, electronic carrier concentrations as low as 10 to the 15th power cm 3 can be measured in cadmium sulfide with magnetic fields as low as 0.1 Tesla.

Subject Categories:

  • Test Facilities, Equipment and Methods

Distribution Statement:

APPROVED FOR PUBLIC RELEASE