High-Sensitivity Infrared Polarimeter.
DEPARTMENT OF THE ARMY WASHINGTON DC
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This paper discusses an infrared polarimeter that measures the amount or degree of the rotation of the plane of polarization of plane polarized radiation after the radiation has passed through a cadium sulfide Cds wafer. Relatively small magnetic fields are used and increased sensitivity is realized by using a chopping wheel to chop the laser beam, providing a reference frequency, and by using a synchronous detector to obtain high signal to noise ratios of the detected signal. As a result of greater sensitivity of the high-sensitivity infrared polarimeter, electronic carrier concentrations as low as 10 to the 15th power cm 3 can be measured in cadmium sulfide with magnetic fields as low as 0.1 Tesla.
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