Time Resolved Extended X-Ray Absorption Fine Structure Spectrometer.
DEPARTMENT OF THE NAVY WASHINGTON DC
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The present invention relates to an X-ray spectrometer for obtaining EXAFS data from a target material. The target material is exposed to incident pulsed synchrotronX-ray radiation having a selected range of continuous spectrum and intensity suitable for obtaining EXAFS data from the material. The transmitted or fluorescence X-rays is detected and integrated over a period of time. The integrator is controlled by a gate synchronous with the pulsed radiation. The integration time of the integrator can be varied. A xenon flash is provided for exciting appropriate materials and is controlled by a gating device which is also synchronized with the radiation pulses.
- Physical Chemistry