Accession Number:

ADD012456

Title:

Radiative Opacity and Emissivity Measuring Device.

Descriptive Note:

Patent,

Corporate Author:

DEPARTMENT OF THE NAVY WASHINGTON DC

Personal Author(s):

• Ripin,Barrett H.
• Whitlock,Robert R.

Report Date:

1986-07-01

Pagination or Media Count:

10.0

Abstract:

This patent discloses an apparatus for measuring the emissivity and opacity coefficients of a test plasma. The apparatus includes a target comprising a support structure of a carrier material with an asymmetrical sample of a test material disposed thereon, a drive for ionizing the test material into a test plasma and the carrier material into a carrier plasma, and spectrographs for measuring the intensity of photons traversing said test plasma. Embodiments including a separate photon source are also disclosed.

Descriptors:

• *PATENTS
• *DIAGNOSTIC EQUIPMENT
• *PLASMA DIAGNOSTICS
• PLASMAS(PHYSICS)
• PHOTONS
• EMISSION SPECTRA
• RADIATION ABSORPTION
• ABSORPTION SPECTRA
• OPACITY
• COEFFICIENTS
• RADIANT INTENSITY
• SPECTROGRAPHS
• X RAY SPECTROSCOPY
• ULTRAVIOLET SPECTROSCOPY

Subject Categories:

• Test Facilities, Equipment and Methods
• Optics
• Plasma Physics and Magnetohydrodynamics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE