Radiative Opacity and Emissivity Measuring Device.
DEPARTMENT OF THE NAVY WASHINGTON DC
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This patent discloses an apparatus for measuring the emissivity and opacity coefficients of a test plasma. The apparatus includes a target comprising a support structure of a carrier material with an asymmetrical sample of a test material disposed thereon, a drive for ionizing the test material into a test plasma and the carrier material into a carrier plasma, and spectrographs for measuring the intensity of photons traversing said test plasma. Embodiments including a separate photon source are also disclosed.
- Test Facilities, Equipment and Methods
- Plasma Physics and Magnetohydrodynamics