Accession Number:

ADD012373

Title:

Metal Thickness Measurements Using Radiography

Descriptive Note:

Patent Application

Corporate Author:

DEPARTMENT OF THE AIR FORCE WASHINGTON DC

Personal Author(s):

• Achrekar, P. M.

Report Date:

1986-04-16

Pagination or Media Count:

11.0

Abstract:

The present invention relates broadly to a radiographic inspection technique, and in particular to a metal thickness measurement method using radiography. The localized areas wherein the effective metal thickness is less than the minimum that is required for radiation shielding and which can render a shielding enclosure functionless, is readily determined. The invention comprises a process for assuring metal thickness in small regions. The actual metal thickness of small regions can be verified by comparing the optical densities of sections of the metal i.e. stepwedge. A comparator microphotometer, which compares optical densities of spectrum lines from spectrophotometers, compares the optical density of spectrum lines on an exposed spectrum plate metal under test with a standard plate stepwedge.

Descriptors:

• *METALS
• *PATENT APPLICATIONS
• *INSPECTION
• *RADIOGRAPHY
• DENSITY
• MEASUREMENT
• SPECTRAL LINES
• SPECTROPHOTOMETERS
• MICROPHOTOMETERS
• RADIATION SHIELDING
• METAL PLATES
• REGIONS
• OPTICAL PROPERTIES
• THICKNESS
• NONDESTRUCTIVE TESTING

Subject Categories:

• Metallurgy and Metallography
• Test Facilities, Equipment and Methods

Distribution Statement:

APPROVED FOR PUBLIC RELEASE