Accession Number:

ADD012255

Title:

Radiation Measuring System Using Transistor Flux Sensors.

Descriptive Note:

Patent,

Corporate Author:

DEPARTMENT OF THE AIR FORCE WASHINGTON DC

Report Date:

1986-02-25

Pagination or Media Count:

11.0

Abstract:

An ionizing radiation intensity dosimeter apparatus and method based on carrier recombination saturation times for irradiated PN junction semiconductor devices following termination of a radiation pulse. Normally-on quiescent condition, moderate radiation doses at relatively high dose rates, and a read-out arrangement employing gated burst counting are included. Author

Subject Categories:

  • Test Facilities, Equipment and Methods

Distribution Statement:

APPROVED FOR PUBLIC RELEASE