Accession Number:

ADD008611

Title:

Test Set for Transient Protection Devices.

Descriptive Note:

Patent Application,

Corporate Author:

DEPARTMENT OF THE ARMY WASHINGTON DC

Personal Author(s):

Report Date:

1981-06-25

Pagination or Media Count:

23.0

Abstract:

A method and device for testing protection circuits comprising positive positive and negative high voltage protection circuits and high voltage fast rise time protection circuits. A bipolar tests signal with alternate positive and negative high voltage pulses is applied to the circuit under test. Determination is made whether the pulses are within a predetermined voltage window. Signals indicating passfail responsive to that determination are generated. A high voltage fast rise time negative pulse is applied to the circuit under test. Changes in the voltage-time waveform are sensed and compared to predetermined levels. Passfail signals are generated in response to the comparison. Author

Subject Categories:

  • Electromagnetic Shielding
  • Test Facilities, Equipment and Methods
  • Electricity and Magnetism
  • Electromagnetic Pulses

Distribution Statement:

APPROVED FOR PUBLIC RELEASE