Accession Number:

ADD008065

Title:

Apparatus and Method for Integrated Circuit Test Analysis.

Descriptive Note:

Patent,

Corporate Author:

DEPARTMENT OF THE AIR FORCE WASHINGTON DC

Personal Author(s):

Report Date:

1980-12-30

Pagination or Media Count:

9.0

Abstract:

An integrated circuit test analysis apparatus for visually interpreting voltage changes of active circuit components uses the electro-optic display effect of circuit electric field upon the liquid crystal layer which is applied over the circuit being tested. The normal state duty cycles in a repeating sequence of test states of the integrated circuit is modified by causing the integrated circuit to pause or maintain a particular state at one or more specific time periods for a predetermined time interval to permit the display to be recorded. Author

Subject Categories:

  • Electrooptical and Optoelectronic Devices
  • Test Facilities, Equipment and Methods

Distribution Statement:

APPROVED FOR PUBLIC RELEASE