Apparatus and Method for Integrated Circuit Test Analysis.
DEPARTMENT OF THE AIR FORCE WASHINGTON DC
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An integrated circuit test analysis apparatus for visually interpreting voltage changes of active circuit components uses the electro-optic display effect of circuit electric field upon the liquid crystal layer which is applied over the circuit being tested. The normal state duty cycles in a repeating sequence of test states of the integrated circuit is modified by causing the integrated circuit to pause or maintain a particular state at one or more specific time periods for a predetermined time interval to permit the display to be recorded. Author
- Electrooptical and Optoelectronic Devices
- Test Facilities, Equipment and Methods