Accession Number:

ADD005158

Title:

Precision X-Ray Diffraction System Incorporating a Laser Aligner.

Descriptive Note:

Patent,

Corporate Author:

DEPARTMENT OF THE ARMY WASHINGTON D C

Personal Author(s):

Report Date:

1977-12-27

Pagination or Media Count:

10.0

Abstract:

This report describes an X-ray diffraction system for crystal analysis employing laser alignment to reduce errors inherent in the mechanical operation of the goniometer apparatus. Author

Subject Categories:

  • Test Facilities, Equipment and Methods

Distribution Statement:

APPROVED FOR PUBLIC RELEASE