Subbottom Rock Mapping Probe.
DEPARTMENT OF THE NAVY WASHINGTON D C
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The patent relates to a subbottom rock mapping probe for measuring the thickness of a sediment layer located on the bottom of a body of water, comprises an automatic, downwardly extending, telescoping probe that is gimbally connected to a support member. Water is forced through the probe to disperse the sediment impeding the probes downward extension. Recording equipment and related measuring devices measure and record the depth of penetration of the probe into the sediment layer from an initial or reference position.
- Physical and Dynamic Oceanography
- Marine Engineering
- Test Facilities, Equipment and Methods