Accession Number:

ADD002403

Title:

Helix Pitch Monitor.

Descriptive Note:

Patent,

Corporate Author:

DEPARTMENT OF THE NAVY WASHINGTON D C

Personal Author(s):

• Allard,Frederick C.

Report Date:

1975-12-09

Pagination or Media Count:

4.0

Abstract:

The patent relates to a method whereby the pitch of a helix is monitored by measurement of the reflection of a light source. Segments of a beam of light are reflected off of the helix, through a mask and onto a photodetector that receives light indicative of the proper spacing of the helix. The photodetector then supplies an output signal to a readout device that indicates if proper spacing of the helix being monitored is present.

Descriptors:

• *Screw threads
• *Quality control
• *Lasers
• *Patents
• Helixes
• Measurement
• Measuring instruments

Subject Categories:

• Lasers and Masers
• Manufacturing and Industrial Engineering and Control of Production Systems

Distribution Statement:

APPROVED FOR PUBLIC RELEASE