Capacitive Discharge Circuit for Surge Current Evaluation of SiC
Summary rept. Jan-Mar 2009
ARMY RESEARCH LAB ADELPHI MD SENSORS AND ELECTRON DEVICES DIRECTORATE
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The power components branch has constructed an apparatus used for surge current testing of prototype semiconductor switch devices. The test apparatus is small-scale. It provides a 1 J pulse at a 5-25 microS pulse width. Shoot-through is a concern in many of the power conversion applications and the pulse provided by this apparatus can provide a very useful model of what device behavior to expect when shoot-through currents occur. Other device characteristics that can also be measured with this apparatus are maximum current rise rate, forward transconductance, high voltage blocking, required gate charge, and safe operating area.
- Electrical and Electronic Equipment
- Test Facilities, Equipment and Methods