Detailed Test Report for the Static Acceleration Testing of a cRIO Data Acquisition System
Test evaluation rept. 5 Aug 2014-7 Aug 2014
NAVAL AIR WARFARE CENTER WEAPONS DIV CHINA LAKE CA
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The purpose of this test series was to evaluate the suitability of a National Instruments Compact Reconfigurable InputOutput cRIO chassis and associated data acquisition cards c-modules for use in a mobile test device. The expected environment the VDAS will experience is a 68-g half-sine waveform of duration approximately 45 milliseconds followed by a diminishing load over the following 250 milliseconds. Two tests were conducted. The first resulted in ejection of c-modules at 114 g s. This test did not meet the success criteria as defined in the test plan. The second test was successful no incidents were recorded by the cRIO data acquisition system. The c-modules were not ejected, nor any physical damage observed in the post test visual examination. The cRIO and associated c-modules have demonstrated the ability to survive in a static acceleration environment, tangent to the mounting plane, up to 136 g s.
- Electrical and Electronic Equipment
- Test Facilities, Equipment and Methods