Accession Number:

ADA625299

Title:

DURIP: Piezoresponse Force Microscope (PFM) with Controlled Environment for Characterization of Flexoelectric Nanostructures

Descriptive Note:

Final rept. 1 Aug 2013-31 Jan 2015

Corporate Author:

NORTH CAROLINA STATE UNIV AT RALEIGH

Personal Author(s):

Report Date:

2015-04-21

Pagination or Media Count:

17.0

Abstract:

A piezo-force microscope PFM system was acquired under this support for characterization of flexoelectric micronanostructures in a controlled environment. The system was installed successfully and a few graduate students were trained by the vendor. Both piezoelectric samples and flexoelectric samples were prepared and characterized using this new system.

Subject Categories:

  • Electrical and Electronic Equipment
  • Infrared Detection and Detectors
  • Active and Passive Radar Detection and Equipment
  • Crystallography
  • Electricity and Magnetism

Distribution Statement:

APPROVED FOR PUBLIC RELEASE