In-situ, Nanosecond, High Resolution TEM Instrumentation for Multi-Disciplinary Research and Education in Nanomaterials
Final rept. 1 Aug 2012-31 Jul 2014
NORTHWESTERN UNIV EVANSTON IL
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This DURIP instrumentation grant allowed us to develop new instrumentation that significantly improved experimental capabilities to characterize the mechanical properties of carbon nanotube and metallic nanowire materials. In particular, the purchased equipment included a nanomanipulator for preparation of nano-specimens for in-situ Scanning Electron Microscopy SEM. The objective of the manipulator was to provide a sample preparation platform for specimens that will subsequently be tested by in-situ SEM or Transmission Electron Microscopy TEM. In addition, a double-tilt, electrical biasing, TEM specimen holder was designed by us and custom fabricated. The electrical biasing capabilities allow the TEM holder to operate microelectromechanical system MEMS devices previously developed by our group for mechanical testing of nanostructures. The two combined instruments therefore provide a system for mechanical testing of nanostructures, combining capabilities of 1 double-tilting in TEM for accurate structural characterization, 2 MEMS testing of nanostructures in-situ TEM, affording high resolution in loads and 3 straightforward sample preparation for TEM and SEM testing of nanostructures.
- Properties of Metals and Alloys
- Miscellaneous Materials
- Test Facilities, Equipment and Methods