Accession Number:

ADA621303

Title:

Raman Scattering from Tin

Descriptive Note:

Final rept.

Corporate Author:

ARMY RESEARCH LAB ADELPHI MD SENSORS AND ELECTRON DEVICES DIRECTORATE

Report Date:

2015-09-01

Pagination or Media Count:

19.0

Abstract:

We are investigating the use of Raman spectroscopy of tin as an analytical tool for discerning specific allotropic differences in ultra-thin tin films, and discerning differences between the tin and the growth substrates of interest. We have acquired spectra from barium difluoride BaF2, crystalline silicon dioxide SiO2, as well as ultra-thin tin semiconductor and tin metallic allotropes, and we are developing a fundamental understanding of the spectra. The research has identified that BaF2 is an excellent passivation layer for two-dimensional tin stanene that will enhance the resolution of the Raman spectrum of future tin layers and facilitate the molecular beam epitaxy MBE growth of stanene.

Subject Categories:

  • Electrical and Electronic Equipment
  • Metallurgy and Metallography
  • Atomic and Molecular Physics and Spectroscopy
  • Radiofrequency Wave Propagation

Distribution Statement:

APPROVED FOR PUBLIC RELEASE