Accession Number:

ADA616417

Title:

Characterization of a Random Anisotropic Conductivity Field with Karhunen-Loeve Methods (Postprint)

Descriptive Note:

Interim rept. 25 Jun 2009-21 Jul 2013

Corporate Author:

DAYTON UNIV RESEARCH INST OH

Personal Author(s):

• Cherry, Matthew R.
• Sabbagh, Harold S.
• Pilchak, Adam L.
• Knopp, Jeremy S.

Report Date:

2013-08-01

Pagination or Media Count:

11.0

Abstract:

While parametric uncertainty quantification for NDE models has been addressed in recent years, the problem of stochastic field parameters such as spatially distributed electrical conductivity has only been investigated minimally in the last year. In that work, the authors treated the field as a one-dimensional random process and Karhunen-Loeve methods were used to discretize this process to make it amenable to UQ methods such as ANOVA expansions. In the present work, we will treat the field as a two-dimensional random process, and the eigenvalues and eigenfunctions of the integral operator will be determined via Galerkin methods. The Karhunen-Loeve methods is extended to two dimensions and implemented to represent this process. Several different choices for basis functions will be discussed, as well as convergence criteria for each. The methods are applied to correlation functions collected over electron backscatter data from highly micro textured Ti-7Al.

Descriptors:

• *EDDY CURRENTS
• ANISOTROPY
• CORRELATION
• ELECTRICAL CONDUCTIVITY
• NONDESTRUCTIVE TESTING
• RANDOM VARIABLES
• TITANIUM ALLOYS
• UNCERTAINTY

Subject Categories:

• Test Facilities, Equipment and Methods
• Electricity and Magnetism

Distribution Statement:

APPROVED FOR PUBLIC RELEASE