Accession Number:

ADA600916

Title:

Complex VLSI Feature Comparison for Commercial Microelectronics Verification

Descriptive Note:

Master's thesis

Corporate Author:

AIR FORCE INSTITUTE OF TECHNOLOGY WRIGHT-PATTERSON AFB OH GRADUATE SCHOOL OF ENGINEERING AND MANAGEMENT

Personal Author(s):

Report Date:

2014-03-27

Pagination or Media Count:

101.0

Abstract:

Shortcomings in IC verification make for glaring vulnerabilities in the form of hardware backdoors, or extraneous operation modes that allow unauthorized, undetected access. The DARPA TRUST program addressed the need for verification of untrusted circuits using industry-standard and custom software. The process developed under TRUST and implemented at the AFRL Mixed Signal Design Center has not been tested using real-world circuits outside of the designated TRUST test cases. This research demonstrates the potential of applying software designed for TRUST test articles on microchips from questionable sources. A specific process is developed for both transistor-level library cell verification and gate-level circuit verification. The relative effectiveness and scalability of the process are assessed.

Subject Categories:

  • Electrical and Electronic Equipment

Distribution Statement:

APPROVED FOR PUBLIC RELEASE