Accession Number:

ADA582557

Title:

Single-Qubit-Gate Error below 0.0001 in a Trapped Ion

Descriptive Note:

Journal article

Corporate Author:

MASSACHUSETTS INST OF TECH CAMBRIDGE

Personal Author(s):

• Brown, K. R.
• Wilson, A. C.
• Colombe, Y.
• Ospelkaus, C.
• Meier, A. M.
• Knill, E.
• Leibfried, D.
• Wineland, D. J.

Report Date:

2011-01-01

Pagination or Media Count:

8.0

Abstract:

With a 9Be trapped-ion hyperfine-states qubit, we demonstrate an error probability per randomized single-qubit gate of 2.02 x 10-5 below the threshold estimate of 10-4 commonly considered sufficient for faulttolerant quantum computing. The 9Be ion is trapped above a microfabricated surface-electrode ion trap and is manipulated with microwaves applied to a trap electrode. The achievement of low single-qubit-gate errors is an essential step toward the construction of a scalable quantum computer.

Descriptors:

• *IONS
• COMPUTERS
• ELECTRODES
• QUANTUM THEORY

Subject Categories:

• Computer Hardware
• Atomic and Molecular Physics and Spectroscopy
• Quantum Theory and Relativity

Distribution Statement:

APPROVED FOR PUBLIC RELEASE