Carbon Nanotube Oscillator Surface Profiling Device and Method of Use
Patent, Filed 26 Aug 2009, Patented 15 Nov 2011
NORTH CAROLINA CENTRAL UNIV DURHAM
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The proposed device is based on a carbon nanotube oscillator consisting of a finite length outer stationary nanotube and a finite length inner oscillating nanotube. Its main function is to measure changes in the characteristics of the motion of the carbon nanotube oscillating near a sample surface, and profile the roughness of this surface. The device operates in a non-contact mode, thus it can be virtually non-wear and non-fatigued system. It is an alternative to the existing atomic force microscope AFM tips used to scan surfaces to determine their roughness.
- Electrical and Electronic Equipment
- Refractory Fibers