Improving Microbolometric Response using Carbon Nanotubes
Final rept. for 20 Aug 2012
ARMY RESEARCH LAB ADELPHI MD SENSORS AND ELECTRON DEVICES DIRECTORATE
Pagination or Media Count:
Single-walled carbon nanotubes CNTs provide a semiconductor material with high sensitivity, detectivity, and a high temperature coefficient of resistance TCR, in comparison to previously used vanadium oxide microbolometers, to detect infrared radiation. The fabrication of the microbolometer uses photolithography and metal deposition processes to create electrical contact pads on the nanotubes, and mounting and wire bonding to a leadless chip carrier. Once fabricated, an experimental dewar is used to test the device at varying temperatures, ranging from 78 K to room temperature. The results indicate that using a semiconductor material with a higher TCR provides a wider range of electrical resistance, and improves the sensitivity and response of infrared imaging technology.
- Refractory Fibers
- Test Facilities, Equipment and Methods