Accession Number:

ADA566029

Title:

Cross-Correlation for Automated Stitching of Two-Dimensional Multi-Tile Electron Backscatter Diffraction Data (Preprint)

Descriptive Note:

Technical rept. 1 Jul-1 Aug 2012

Corporate Author:

AIR FORCE RESEARCH LAB WRIGHT-PATTERSON AFB OH MATERIALS AND MANUFACTURING DIRECTORATE

Personal Author(s):

• Tiley, J. S.
• Pilchak, A. L.
• Shade, P. A.
• Ballard, D. L.
• Shiveley, A. R.

Report Date:

2012-08-01

Pagination or Media Count:

34.0

Abstract:

A method for automatically aligning consecutive datasets of large, two-dimensional multi-tile electron backscatter diffraction EBSD scans with high accuracy was developed. The method involves first locating grain and phase boundaries within search regions containing overlapping data in adjacent scan tiles, and subsequently using cross-correlation algorithms to determine the relative position of the individual scan tiles which maximizes the fraction of overlapping boundaries. Savitzky-Golay filtering in two dimensions was used to estimate the background, which was then subtracted from the cross-correlation to enhance the peak signal in samples with a high density of interfaces. The technique was demonstrated on datasets with a range of grain boundary densities. The equations were implemented as enhancements to a recently published open source code for automated stitching of multi-tile datasets.

Descriptors:

• *BACKSCATTERING
• *ELECTRON DIFFRACTION
• ACCURACY
• ALGORITHMS
• AUTOMATION
• BACKGROUND
• BOUNDARIES
• CODING
• CROSS CORRELATION
• DENSITY
• EQUATIONS
• HIGH DENSITY
• HIGH RATE
• PEAK VALUES
• POSITION(LOCATION)
• REGIONS
• SAMPLING
• SCANNING
• SEARCHING
• SIGNALS
• SOURCES
• TILES
• TWO DIMENSIONAL

Subject Categories:

• Atomic and Molecular Physics and Spectroscopy

Distribution Statement:

APPROVED FOR PUBLIC RELEASE