Accession Number:

ADA561152

Title:

Impact of Edge-Barrier Pinning in Superconducting Thin Films (Postprint)

Descriptive Note:

Journal article

Corporate Author:

DAYTON UNIV OH

Personal Author(s):

• Jones, W. A.
• Mullins, M. J.
• Barnes, P. N.
• Haugan, T. J.
• Baca, F. J.
• Emergo, R. L.
• Wu, J.
• Clem, J. R.

Report Date:

2012-02-01

Pagination or Media Count:

5.0

Abstract:

It has been suggested that edge-barrier pinning might cause the critical current density Jc in bridged superconducting films to increase. Subsequent work indicated that this edge-barrier effect does not impact bridges larger than 1 micrometers. However, we provide a theoretical assessment with supporting experimental data suggesting edge-barrier pinning can significantly enhance Jc for bridges of a few microns or even tens of microns thus skewing any comparisons among institutions. As such, when reporting flux pinning and superconductor processing improvements for Jc comparisons, the width of the sample has to be taken into consideration as is currently done with film thickness.

Descriptors:

• *SUPERCONDUCTORS
• *THIN FILMS
• BRIDGES
• CURRENT DENSITY
• EXPERIMENTAL DATA
• FILMS
• FLUX(RATE)
• IMPACT
• PROCESSING
• THICKNESS
• WIDTH

Subject Categories:

• Electricity and Magnetism
• Solid State Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE