Accession Number:

ADA523464

Title:

Comparison of Power Dependence of Microwave Surface Resistance of Unpatterned and Patterned YBCO Thin Film

Descriptive Note:

Corporate Author:

MASSACHUSETTS INST OF TECH CAMBRIDGE

Report Date:

2008-02-01

Pagination or Media Count:

19.0

Abstract:

The effect of the patterning process on the nonlinearity of the microwave surface resistance RS of YBCO thin films is investigated. With the use of a sapphire dielectric resonator and a stripline resonator, the microwave RS of YBCO thin films was measured before and after the patterning process, as a function of temperature and the rf peak magnetic field in the film. The microwave loss was also modeled, assuming a J2 rf dependence of ZSJrf on current density Jrf . Experimental and modeled results show that the patterning has no observable effect on the microwave residual RS or on the power dependence of RS.

Subject Categories:

  • Electrical and Electronic Equipment
  • Electricity and Magnetism

Distribution Statement:

APPROVED FOR PUBLIC RELEASE