Friction in Full View
Final rept. 15 Feb 2008-30 Nov 2009
NORTHWESTERN UNIV EVANSTON IL
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We have used an in situ transmission electron microscopy TEM technique to perform tribological investigations on various thin films. Using a Nanofactory HSIOO STM-TEM sample holder and Tecnai F20ST TEM 200 kV, we were able to slide sharp probe tips on samples to study the single-asperity behavior. During sliding we were able to simultaneously use the various instrumentation of the TEM, including bright and dark field imaging, electron diffraction, and chemical analysis in the form of ED X and EELS at high resolution.
- Test Facilities, Equipment and Methods
- Atomic and Molecular Physics and Spectroscopy
- Physical Chemistry