Accession Number:

ADA513228

Title:

Reflected Signal Analysis

Descriptive Note:

Final rept. May-Sep 2009

Corporate Author:

ARMY RESEARCH LAB ADELPHI MD SENSORS AND ELECTRON DEVICES DIRECTORATE

Report Date:

2010-01-01

Pagination or Media Count:

32.0

Abstract:

We present a framework for forensic identification of RF devices using specially designed probe signals. This framework applies to a broad range of devices and models. Probe signals, device models, feature selection, and classifier design are described. For the device model, we introduce a method for determining a nonlinearity based on a known diode model. Experimental results are given to verify our approach.

Subject Categories:

  • Electrical and Electronic Equipment
  • Miscellaneous Detection and Detectors

Distribution Statement:

APPROVED FOR PUBLIC RELEASE