Spatially-Resolved System for Polarimetric Measurements at Subwavelength Scales
Final rept. 1 Jul 2007-30 Dec 2008
UNIVERSITY OF CENTRAL FLORIDA ORLANDO SCHOOL OF OPTICS/CREOL
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This proposal will purchase an Aurora-3 Near-Field Scanning Optical Microscope NSOM that has the capability of high, sub-wavelength spatial resolution, improved focusing mechanism, dual-light path design, and accurate probe-to-sample patented measuring capability making it the most advanced NSOM available. The proposed instrumentation offers superior performance in near-field optical characterization and contrast mechanisms with the high resolution of scanning probe microscopy techniques. The acquisition of this equipment will allow the PI to expand greatly his capability in 3D polarimetry. There is also a great promise to pursue nano-designs of photonics-based technologies with this NSOM.
- Test Facilities, Equipment and Methods