Accession Number:

ADA505761

Title:

Threshold Voltage Instability in A-Si:H TFTS and the Implications for Flexible Displays and Circuits

Descriptive Note:

Conference paper

Corporate Author:

ARIZONA STATE UNIV TEMPE

Personal Author(s):

• Allee, D.
• Clark, L.
• Shringarpure, R.
• Venugopal, S.
• Darbanian, N.
• Li, Z.
• Bawolek, E.
• Baugh, K.
• Raupp, G.
• Forsythe, E.
• Morton, D.

Report Date:

2008-12-01

Pagination or Media Count:

9.0

Abstract:

After a brief review of the characteristics of electrical stress degradation of flexible, amorphous silicon thin film transistors, the implications for various types of flexible circuitry including active matrix backplanes, integrated drivers and general purpose digital circuitry are examined. A circuit modeling tool that enables the prediction of complex circuit degradation is presented. Experimental results for a variety of flexible digital circuits including programmable logic arrays and memories are presented. Finally, we discuss the principal remaining challenges to building a fully flexible electronic system.

Descriptors:

• *COMPUTER AIDED DESIGN
• INTEGRATED SYSTEMS
• SYMPOSIA
• MODELS
• THRESHOLD EFFECTS
• TRANSISTORS
• THIN FILMS
• ARRAYS
• AMORPHOUS MATERIALS
• COMPLEMENTARY METAL OXIDE SEMICONDUCTORS
• FLEXIBLE STRUCTURES
• EXPERIMENTAL DATA
• COMPUTER PROGRAMMING

Subject Categories:

• Electrical and Electronic Equipment
• Electrooptical and Optoelectronic Devices
• Solid State Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE