Accession Number:

ADA504053

Title:

Stress Gradient Induced Strain Localization in Metals: High Resolution Strain Cross Sectioning via Synchrotron X-Ray Diffraction (POSTPRINT)

Descriptive Note:

Journal article postprint

Corporate Author:

AIR FORCE RESEARCH LAB WRIGHT-PATTERSON AFB OH MATERIALS AND MANUFACTURING DIRECTORATE

Report Date:

2008-04-01

Pagination or Media Count:

12.0

Abstract:

Strain localization in the presence of a stress gradient is a phenomenon common to many systems described by continuum mechanics. Variations of this complex phenomenon lead to interesting nonlinear effects in materialsengineering science as well as in other fields. Here, the synchrotron based energy dispersive x-ray diffraction EDXRD technique is used for high spatial resolution profiling of both compression and tension induced strain localization in important materialsengineering problems. Specifically, compression induced strain localization in shot peened materials and tension induced strain localization in the plastic zones adjoining the faces of a fatigue crack are profiled. The utility of the EDXRD synchrotron technique for nondestructively cross-sectioning strain variations on small length scales is described. While the strain field profiling relies on the shift of the Bragg lines, the data show that plastic deformation regions can also consistently be seen in the broadening of the Bragg peaks through the full width at half maximum parameter.

Subject Categories:

  • Properties of Metals and Alloys
  • Test Facilities, Equipment and Methods
  • Particle Accelerators
  • Nuclear Physics and Elementary Particle Physics
  • Mechanics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE