Accession Number:

ADA499735

Title:

Spatially Resolved Photocurrent Mapping of Operating Organic Photovoltaic Devices Using Atomic Force Photovoltaic Microscopy

Descriptive Note:

Corporate Author:

NORTHWESTERN UNIV EVANSTON IL OFFICE OF RESEARCH SPONSORED PROJECTS

Report Date:

2008-01-01

Pagination or Media Count:

7.0

Abstract:

A conductive atomic force microscopy cAFM technique, atomic force photovoltaic microscopy AFPM, has been developed to characterize spatially localized inhomogeneities in organic photovoltaic OPV devices. In AFPM, a biased cAFM probe is raster scanned over an array of illuminated solar cells, simultaneously generating topographic and photocurrent maps. As proof of principle, AFPM is used to characterize OPVs, revealing substantial device to device and temporal variations in the short-circuit current. The flexibility of AFPM suggests applicability to nanoscale characterization of a wide range of optoelectronically active materials and devices.

Subject Categories:

  • Electrooptical and Optoelectronic Devices
  • Electricity and Magnetism

Distribution Statement:

APPROVED FOR PUBLIC RELEASE