Metrics for TRUST in Integrated Circuits
JOHNS HOPKINS UNIV LAUREL MD APPLIED PHYSICS LAB
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In this paper we report on metrics approaches adapted for the DARPA TRUST in ICs program. A metrics approach initially focused on detection of malicious alterations in integrated circuit die has been adapted for use on FPGA bitstreams and the ASIC design process. We also discuss metrics for techniques focused on prevention of malicious alterations.
- Electrical and Electronic Equipment