Accession Number:

ADA482033

Title:

Metrics for TRUST in Integrated Circuits

Descriptive Note:

Conference paper

Corporate Author:

JOHNS HOPKINS UNIV LAUREL MD APPLIED PHYSICS LAB

Report Date:

2008-06-01

Pagination or Media Count:

6.0

Abstract:

In this paper we report on metrics approaches adapted for the DARPA TRUST in ICs program. A metrics approach initially focused on detection of malicious alterations in integrated circuit die has been adapted for use on FPGA bitstreams and the ASIC design process. We also discuss metrics for techniques focused on prevention of malicious alterations.

Subject Categories:

  • Electrical and Electronic Equipment

Distribution Statement:

APPROVED FOR PUBLIC RELEASE