Accession Number:

ADA465166

Title:

Structural Effects in the Dielectric Constant Rare-Earth Oxides: Nd2O3

Descriptive Note:

Journal article

Corporate Author:

LABORATOIRE D'ELECTROSTATIQUE AT DES MATERIAUX DIELECTRIQUES CEDEX (FRANCE)

Personal Author(s):

Report Date:

2006-01-01

Pagination or Media Count:

11.0

Abstract:

Thin films of Nd2O3 have been studied. For the amorphous phase the dielectric constant is 11 whilst the refractive index is 1.76 0.02, in the cubic form these values are 13.6 15.4 and 1.93 0.02. Hexagonal films have dielectric constants in the range 17 21 and estimates based upon the cubic values lead to k 27, we were unable to determine a reliable refractive index value. The normally high temperature hexagonal phase could be nucleated on a Si substrate by deposition at relatively low temperature 280 C.

Subject Categories:

  • Electrical and Electronic Equipment
  • Miscellaneous Materials
  • Electricity and Magnetism

Distribution Statement:

APPROVED FOR PUBLIC RELEASE