Accession Number:

ADA461891

Title:

Correlation Between the XPS Peak Shapes of Y(1)Ba(2)Cu(3)O(7-x )and Film Quality (Postprint)

Descriptive Note:

Journal /article

Corporate Author:

AIR FORCE RESEARCH LAB WRIGHT-PATTERSON AFB OH PROPULSION DIRECTORATE

Report Date:

2003-06-01

Pagination or Media Count:

6.0

Abstract:

X-ray photoelectron spectroscopy XPS depth profiling was used to investigate the compositional and chemical profile of a typical YBCO coated conductor architecture. Results of the process revealed that the Y3d photoelectronic peak shape in these films is very different from bulk YBCO. To investigate this, several samples of Y1Ba2Cu3O7-x thin films were intentionally created of varying quality. The films were deposited on LaAlO3 by pulsed laser deposition with Jc values ranging from poorly conducting up to several MAcm2. Initial results indicated a potential correlation between the Y3d XPS peak shape full-width-half-maximum of the YBCO and the film quality. A potential correlation may also exist with the Cu2p Ba3d ratio indicating an interrelationship to the FWHM of the Y3d peak. Film quality was determined by current transport, resistive Tc, and AC magnetic susceptibility measurements

Subject Categories:

  • Inorganic Chemistry
  • Electrical and Electronic Equipment
  • Coatings, Colorants and Finishes
  • Electricity and Magnetism

Distribution Statement:

APPROVED FOR PUBLIC RELEASE