Accession Number:

ADA461458

Title:

The Effects of Ionising Radiation on MEMS Silicon Strain Gauges: Preliminary Background and Methodology

Descriptive Note:

Technical Note

Corporate Author:

DEFENCE SCIENCE AND TECHNOLOGY ORGANISATION VICTORIA (AUSTRALIA) HUMAN PROTECTION AND PERFORMANCE DIV

Report Date:

2006-09-01

Pagination or Media Count:

26.0

Abstract:

Despite limited reporting in the open literature describing the effects of ionising radiation on MicroElectroMechanical System MEMS devices or components, there are indications that some MEMS technologies exhibit vulnerability to radiation effects. To begin to gain an understanding of the issues surrounding the susceptibility of MEMS technologies, an investigation into the effects of radiation damage on the electronic and the mechanical properties of a specific MEMS silicon strain gauge will be conducted. The methodology followed is outlined in this report.

Subject Categories:

  • Electrical and Electronic Equipment
  • Atmospheric Physics
  • Atomic and Molecular Physics and Spectroscopy

Distribution Statement:

APPROVED FOR PUBLIC RELEASE