Left Handed Materials Based on Magnetic Nanocomposites
Final rept. 1 Jun 2003-31 Aug 2006
DELAWARE STATE COLL DOVER DEPT OF PHYSICS AND ASTRONOMY
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A new measurement technique has been proposed to determine the sign of the index of refraction in thin film samples. We have observed signature of negative index in NiFe-SiO2 magnetic granular materials and in NiFeSiO2 multilayers. However, the signal is weak due to thin sample and is very much sample dependent, we could not consistently confirm the properties. We have theoretically established selection criteria for magnetic materials and their structures to achieve LHMs or NIMs. We have theoretically proposed several new structures that show negative index of refraction NIMs. These structures include 1 Double negative materials DNMs for LHMs EM multilayers consisting of alternating negative e and negative u layers. 2 Single negative materials SNMs for NIMs FerriteSemiconductor or Oxides multilayer with negative u. We have developed a theory that unifies DNMs and SNMs as a function of two fundamental material parameters quality factors for permittivity Qeee and permeability Quuu.
- Laminates and Composite Materials
- Electricity and Magnetism