Time-Resolved IR Electroluminescence Spectroscopy System
Final rept., 1 Jul 2005-31 May 2006
ARIZONA STATE UNIV TEMPE CENTER FOR SOLID STATE ELECTRONICS RESEARCH
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A time-resolved PL and EL system has been built to study optical and thermal properties of optoelectronic devices. The system offers very flexible capabilities for time-resolved PL and EL measurements with a temporal resolution of 1 ns over a wave-length range from 400 nm to 12 micrometers. The system is also seamlessly integrated with our existing Fourier transform infrared spectrometer for quasi-CW PL and EL measurements up to 25 micrometers. The use of a temperature variable cryostat and probe station allows all experiments to be carried out at any given temperature between 10-450K. This versatile system enables many experiments, which will benefit DoD funded research, including two MURI programs entitled Semiconductor Optical Upconversion Refrigeration and Si Based Lasers, which are funded through AFOSR. An immediate application of this unique system is to use low temperature time-resolved EL spectroscopy to study electroluminescence refrigeration in LEDs.
- Electrooptical and Optoelectronic Devices
- Atomic and Molecular Physics and Spectroscopy